{"created":"2023-07-25T10:28:20.501566+00:00","id":1115,"links":{},"metadata":{"_buckets":{"deposit":"f0369fdd-61e0-4b6a-8b1e-606004199ff1"},"_deposit":{"created_by":2,"id":"1115","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"1115"},"status":"published"},"_oai":{"id":"oai:it-hiroshima.repo.nii.ac.jp:00001115","sets":["1:18:389"]},"author_link":["5315","5314"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2020-02","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"136","bibliographicPageStart":"133","bibliographicVolumeNumber":"54","bibliographic_titles":[{"bibliographic_title":"広島工業大学紀要. 研究編"}]}]},"item_10002_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The author proposed a prediction method to find students at drop-out risks as early as possible by\nusing the learning check testing (LCT) results, where the nearest-neighbor method was used to find\nthe similarity of the cumulative LCT ability trends in the previous paper. Even if we use almost\nthe first half of the LCT results, we can predict the failed students in final examinations. However,\nthe predicted failed students covered the half of the actual failed students. In this paper, to raise\nthe prediction accuracy for finding the students at risk, we added another information, the follow-up\nprogram testing (FPT) results via the FPT points defined here. Using this FPT point information\nand the LCT ability trends together, we can predict the students at risk with higher prediction\naccuracy than that when we only use the LCT ability trends.","subitem_description_type":"Abstract"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"広島工業大学"}]},"item_10002_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"publisher"}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11599110","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13469975","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"廣瀬, 英雄"},{"creatorName":"ヒロセ, ヒデオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"5314","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"HIROSE, Hideo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"5315","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-03-30"}],"displaytype":"detail","filename":"research54_133-136.pdf","filesize":[{"value":"894.4 kB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"research54_133-136.pdf","url":"https://it-hiroshima.repo.nii.ac.jp/record/1115/files/research54_133-136.pdf"},"version_id":"5cbe4e84-975c-4c9d-b0a0-be34af69a6c8"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"follow-up program testing","subitem_subject_scheme":"Other"},{"subitem_subject":"learning check testing","subitem_subject_scheme":"Other"},{"subitem_subject":"item response theory","subitem_subject_scheme":"Other"},{"subitem_subject":"drop-out","subitem_subject_scheme":"Other"},{"subitem_subject":"FPT point","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"LCT トレンドとFPT トレンドを組み合わせた期末試験の合否予測","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"LCT トレンドとFPT トレンドを組み合わせた期末試験の合否予測"},{"subitem_title":"Success/Failure Prediction for Final Examination Using the LCT Results and FPT Results","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"2","path":["389"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-03-30"},"publish_date":"2023-03-30","publish_status":"0","recid":"1115","relation_version_is_last":true,"title":["LCT トレンドとFPT トレンドを組み合わせた期末試験の合否予測"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-07-25T10:33:12.013029+00:00"}