{"created":"2023-07-25T10:28:18.981608+00:00","id":1085,"links":{},"metadata":{"_buckets":{"deposit":"9a0e72c6-35a4-4404-896d-31b26f42942e"},"_deposit":{"created_by":2,"id":"1085","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"1085"},"status":"published"},"_oai":{"id":"oai:it-hiroshima.repo.nii.ac.jp:00001085","sets":["1:18:388"]},"author_link":["5207","5206"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-02","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"175","bibliographicPageStart":"171","bibliographicVolumeNumber":"53","bibliographic_titles":[{"bibliographic_title":"広島工業大学紀要. 研究編"}]}]},"item_10002_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"By looking at the relationships between the numbers of correct answers and the time durations that students spend in taking tests, we have found that there are typical patterns. The patterns of the time durations spent in taking the test to each number of correct answers depends on the difficulties of the questions. To easy problems to solve, smart students use less time to solve the problems and students with low academic ability need much time to solve. To moderate problems to solve, every student requires the similar time duration to solve the problems. To difficult problems to solve, many students tend to use full time to the pre-specified time duration, but some students with low ability are reluctant to tackle the problem.","subitem_description_type":"Abstract"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"広島工業大学"}]},"item_10002_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"publisher"}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11599110","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13469975","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"廣瀬, 英雄"},{"creatorName":"ヒロセ, ヒデオ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"5206","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Hirose, Hideo","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"5207","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-03-30"}],"displaytype":"detail","filename":"research53_171-175.pdf","filesize":[{"value":"1.5 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"research53_171-175.pdf","url":"https://it-hiroshima.repo.nii.ac.jp/record/1085/files/research53_171-175.pdf"},"version_id":"19c47c8a-1bd2-4603-82b2-c28d33f5bb4a"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"online testing","subitem_subject_scheme":"Other"},{"subitem_subject":"learning check testing","subitem_subject_scheme":"Other"},{"subitem_subject":"item response theory","subitem_subject_scheme":"Other"},{"subitem_subject":"time duration spent in testing","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"ラーニングアナリティクス： －LCT受験時間とLCT成績の関係－","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ラーニングアナリティクス： －LCT受験時間とLCT成績の関係－"},{"subitem_title":"Learning Analytics: A Relationship Between the LCT Time Duration Spent in Testing and the LCT Ability","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"2","path":["388"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-03-30"},"publish_date":"2023-03-30","publish_status":"0","recid":"1085","relation_version_is_last":true,"title":["ラーニングアナリティクス： －LCT受験時間とLCT成績の関係－"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-07-25T10:33:52.424898+00:00"}