{"created":"2023-07-25T10:28:18.178146+00:00","id":1073,"links":{},"metadata":{"_buckets":{"deposit":"abd1c368-71b9-4a9c-8956-84e9f1ddf462"},"_deposit":{"created_by":2,"id":"1073","owners":[2],"pid":{"revision_id":0,"type":"depid","value":"1073"},"status":"published"},"_oai":{"id":"oai:it-hiroshima.repo.nii.ac.jp:00001073","sets":["1:18:388"]},"author_link":["5161","5163","5160","5162"],"item_10002_biblio_info_7":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicIssueDates":{"bibliographicIssueDate":"2019-02","bibliographicIssueDateType":"Issued"},"bibliographicPageEnd":"88","bibliographicPageStart":"79","bibliographicVolumeNumber":"53","bibliographic_titles":[{"bibliographic_title":"広島工業大学紀要. 研究編"}]}]},"item_10002_description_19":{"attribute_name":"フォーマット","attribute_value_mlt":[{"subitem_description":"application/pdf","subitem_description_type":"Other"}]},"item_10002_description_5":{"attribute_name":"抄録","attribute_value_mlt":[{"subitem_description":"The technology surrounding semiconductors is making a steady progress. They are becoming more integrated by micro fabrication technology and the innovative application of such technology is being developed rapidly by finding or applying new materials. In this study, we pay attention to material surface because it affects the quality of products. We analyze both theoretical and experimental sides and estimate the results synthetically. We will apply this method to Materials Informatics and contribute to developing new materials.","subitem_description_type":"Abstract"}]},"item_10002_publisher_8":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"広島工業大学"}]},"item_10002_rights_15":{"attribute_name":"権利","attribute_value_mlt":[{"subitem_rights":"publisher"}]},"item_10002_source_id_11":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11599110","subitem_source_identifier_type":"NCID"}]},"item_10002_source_id_9":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"13469975","subitem_source_identifier_type":"ISSN"}]},"item_10002_version_type_20":{"attribute_name":"著者版フラグ","attribute_value_mlt":[{"subitem_version_resource":"http://purl.org/coar/version/c_970fb48d4fbd8a85","subitem_version_type":"VoR"}]},"item_creator":{"attribute_name":"著者","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"岡光, 序治"},{"creatorName":"オカミツ, ノブハル","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"5160","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"田中, 武"},{"creatorName":"タナカ, タケシ","creatorNameLang":"ja-Kana"}],"nameIdentifiers":[{"nameIdentifier":"5161","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Okamitsu, Nobuharu","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"5162","nameIdentifierScheme":"WEKO"}]},{"creatorNames":[{"creatorName":"Tanaka, Takeshi","creatorNameLang":"en"}],"nameIdentifiers":[{"nameIdentifier":"5163","nameIdentifierScheme":"WEKO"}]}]},"item_files":{"attribute_name":"ファイル情報","attribute_type":"file","attribute_value_mlt":[{"accessrole":"open_date","date":[{"dateType":"Available","dateValue":"2023-03-30"}],"displaytype":"detail","filename":"research53_079-088.pdf","filesize":[{"value":"2.4 MB"}],"format":"application/pdf","licensetype":"license_note","mimetype":"application/pdf","url":{"label":"research53_079-088.pdf","url":"https://it-hiroshima.repo.nii.ac.jp/record/1073/files/research53_079-088.pdf"},"version_id":"5fca83c4-08c1-4b26-9380-0dea6f0c8880"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"surface analysis","subitem_subject_scheme":"Other"},{"subitem_subject":"XPS","subitem_subject_scheme":"Other"},{"subitem_subject":"DV-Xα","subitem_subject_scheme":"Other"},{"subitem_subject":"SESSA","subitem_subject_scheme":"Other"},{"subitem_subject":"Materials Informatics","subitem_subject_scheme":"Other"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourcetype":"departmental bulletin paper","resourceuri":"http://purl.org/coar/resource_type/c_6501"}]},"item_title":"DV-Xα分子軌道法によるXPSスペクトルの理論と実験的評価およびマテリアルズ・インフォマティクスの応用","item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"DV-Xα分子軌道法によるXPSスペクトルの理論と実験的評価およびマテリアルズ・インフォマティクスの応用"},{"subitem_title":"The Theoretical and Experimental Estimation about XPS Spectra Using DV-Xα Molecular-Orbital Method and Its Application to Materials Informatics","subitem_title_language":"en"}]},"item_type_id":"10002","owner":"2","path":["388"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-03-30"},"publish_date":"2023-03-30","publish_status":"0","recid":"1073","relation_version_is_last":true,"title":["DV-Xα分子軌道法によるXPSスペクトルの理論と実験的評価およびマテリアルズ・インフォマティクスの応用"],"weko_creator_id":"2","weko_shared_id":-1},"updated":"2023-07-25T10:34:08.433917+00:00"}